Publications (Professor Chien-Wei Wu)
A. Publications:期刊論文 (Journal Papers)
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Kang, H. Y., Lee, Amy H. I., Wu, Chien-We and Lee, C. H.(2017). An efficient method for dynamic-demand joint replenishment problem with multiple suppliers and multiple vehicles. INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH.【SCI】
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Wu, Chien-Wei and Wang, Z. H. (2017). Developing a variables multiple dependent state sampling plan with simultaneous consideration of process yield and quality loss. INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH.【SCI】
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Wu, Chien-Wei, Shu, M. H. and Liu, S. W. (2017). A Situationally Sample-Size-Adjusted Sampling Scheme Based on Process Yield Verification. QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL.【SCI】
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Liao, M. Y., Wu, Wu, Chien-Wei, Wen, S. H. (2017). Assessing S-Type Process Quality of Data Involving Batch-to-Batch Variation. JOURNAL OF TESTING AND EVALUATION. 【SCI】
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Wu, Chien-Wei, Aslam, M. and Jun, C. H. (2017).Developing a variables two-plan sampling system for product acceptance determination. COMMUNICATIONS IN STATISTICS-THEORY AND METHODS.【SCI】
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Liao, M. Y., Lin, C. H., Wu, Chien-Wei and Yang, C. H. (2017). Reliable confidence intervals for assessing normal process incapability. COMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATION.【SCI】
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Wu, Chien-Wei, Liao, M. Y., Lin, C. W. and Lin, T. L. (2016). Testing and Ranking Multiple Wafer-Manufacturing Processes With Fuzzy-Quality Data. JOURNAL OF TESTING AND EVALUATION. 【SCI】
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Rakhmawati, D. Y., Yang, C. L. and Wu, Chien-Wei (2016). Process Capability Assessment for Asymmetric Tolerances with Consideration of Gauge Measurement Errors. COMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATION.【SCI】
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Rakhmawati, D. Y., Wu, Chien-Wei and Yang, C. L. (2016). Performance evaluation of processes with asymmetric tolerances in the presence of gauge measurement errors. COMMUNICATIONS IN STATISTICS-THEORY AND METHODS.【SCI】
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Lee, Amy H. I., Wu, Chien-Wei and Chen, Y. W. (2016). A modified variables repetitive group sampling plan with the consideration of preceding lots information. ANNALS OF OPERATIONS RESEARCH.【SCI】
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Liu, S. W. and Wu, Chien-Wei (2016). A quick switching sampling system by variables for controlling lot fraction nonconforming. INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH.【SCI】
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Wu, Chien-Wei, Lee, Amy H. I. and Chen, Y. W. (2016). A Novel Lot Sentencing Method by Variables Inspection Considering Multiple Dependent State. QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL.【SCI】
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Wu, Chien-Wei, Wang, Z. H. and Shu, M. H. (2015). A lots-dependent variables sampling plan considering supplier's process loss and buyer's stipulated specifications requirement. INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH. 【SCI】
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Wu, Chien-Wei, Chen, J. C. and Wu, T. H. (2015). A flexible sampling scheme for variables inspection with loss consideration. JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION.【SCI】
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Wu, Chien-Wei, Shu, M., Nugroho, A. A. and Kurniati, N.(2015). A flexible process-capability-qualified resubmission-allowed acceptance sampling scheme. COMPUTERS & INDUSTRIAL ENGINEERING.【SCI】
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Wu, Chien-Wei,Wu, T.H. and Chen, Tiffany (2015). Developing a variables repetitive group sampling scheme by considering process yield and quality loss. INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH. 【SCI】
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Kurniati, N., Yeh, R. H. and Wu, Chien-Wei (2015). Designing a variables two-plan sampling system of type TNTVSS-(n(T), n(N); k) for controlling process fraction nonconforming with unilateral specification limit. INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH. 【SCI】
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Liao, M. Y., Wu, Chien-Wei and Lin, C.-H.(2015). Assessing True TFT-LCD Process Quality in the Presence of Unavoidable Measurement Errors. JOURNAL OF TESTING AND EVALUATION. 【SCI】
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Kurniati, N., Yeh, R.-H. and Wu, Chien-Wei (2015). A Sampling Scheme for Resubmitted Lots Based on One-Sided Capability Indices. QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT. 【SCI】
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Wu, Chien-Wei, Aslam, M., Chen, J. C. and Jun, C. H. (Accepted). A repetitive group sampling plan by variables inspection for product acceptance determination. European Journal of Industrial Engineering.【SCI, EI】
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Rakhmawati, D. Y., Wu, Chien-Wei and Yang, C. L. (Accepted). Performance evaluation of processes with asymmetric tolerances in the presence of gauge measurement errors. Communications in Statistics - Theory and Methods.【SCI, EI】
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Wu, Chien-Wei and Liao, M. Y. (Accepted). Fuzzy nonlinear programming approach for evaluating and ranking process yields with imprecise data. Fuzzy Sets and Systems, 246, 146-155.【SCI, EI】
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Rakhmawati, D. Y., Yang, C. L. and Wu, Chien-Wei (Accepted). Process capability assessment for asymmetric tolerances with consideration of gauge measurement errors. Communications in Statistics - Simulations and Computation.【SCI, EI】
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Wu, Chien-Wei and Liu, S. W. (2014). Developing a sampling plan by variables inspection for controlling lot fraction of defectives. Applied Mathematical Modelling, 38(9-10), 2303-2310【SCI, EI】
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Liu, S. W., Lin, S. W. and Wu, Chien-Wei (2014). A resubmitted sampling scheme by variables inspection for controlling lot fraction nonconforming, International Journal of Production Research, 52(12), 3744-3754. 【SCI, EI】
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Liu, S. W. and Wu, Chien-Wei (2014). Design and construction of a variables repetitive group sampling plan for unilateral specification Limit. Communications in Statistics - Simulation and Computation, 43(8), 1866-1878. 【SCI, EI】
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Wu, Chien-Wei, Chang, Y. C. and Liao, M. Y. (2014). Fuzzy estimation for process loss assessment. Journal of the Chinese Institute of Engineers, 37(1), 1-6.【SCI, EI】
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Chang, C. C., Wu, T. H. and Wu, Chien-Wei (2013). An efficient approach to determine cell formation, cell layout and intracellular machine sequence in cellular manufacturing systems. Computers & Industrial Engineering, 66(2), 438-450. 【SCI, EI】
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Wu, Chien-Wei, Lin, C. W. and Chen, J. C. (2013). Improved approach for process performance evaluation with the consideration of process yield and quality loss. International Journal of Production Research, 51(21), 6397-6409. 【SCI, EI】
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Wang, Y. C., Wu, Chien-Wei and Chen, T. (2013). A fuzzy-neural approach for optimizing the performance of job dispatching in a wafer fabrication factory. International Journal of Advanced Manufacturing Technology, 67(1-4), 189-202. 【SCI, EI】
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Chen, T., Rajendran, C. and Wu, Chien-Wei (2013). Advanced dispatching rules for large-scale manufacturing systems. International Journal of Advanced Manufacturing Technology, 67(1-4), 1-3. 【SCI, EI】
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Wu, Chien-Wei, Liao, M. Y. and Yang, T. T. (2013). Efficient methods for comparing two process yields – strategies on supplier selection. International Journal of Production Research, 51(5), 1587-1602.【SCI, EI】
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Aslam, M., Wu, Chien-Wei, Azam, M and Jun, C. H. (2013). Variable sampling inspection for resubmitted lots based on process capability index Cpk for normally distributed items. Applied Mathematical Modelling, 37(3), 667-675.【SCI, EI】
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Aslam, M., Wu, Chien-Wei, Jun, C. H., Azam, M. and Negrin, I. (2013). Developing a variables repetitive sampling plan based on Cpk with unknown mean and variance. Journal of Statistical Computation and Simulation, 83(8), 1507-1517.【SCI, EI】
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Wu, Chien-Wei (2013). Process performance evaluation based on Taguchi capability index with the consideration of measurement errors. International Journal of Systems Science, 44(8), 1386-1399.【SCI, EI】
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Liao, M. Y., Wu, Chien-Wei and Wu, J. W (2013). Fuzzy inference to supplier evaluation and selection based on quality index: a flexible approach. Neural Computing & Applications, 23(1), 117-127.【SCI, EI】
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Wu, Chien-Wei. (2012). An efficient inspection scheme for variables based on Taguchi capability index. European Journal of Operational Research, 223(1), 116-122【SCI, EI】
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Wu, Chien-Wei and Shu, M. H. (2012). A novel approach for measuring the largest process-loss information in multiple production lines condition. International Journal of Production Research, 50(14), 3809-3820【SCI, EI】
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Wu, Chien-Wei and Liao, M. Y. (2012). Measuring process yield with the contamination of measurement errors – quality control for silicon wafer manufacturing processes in semiconductor industry. IEEE Transactions on Semiconductor Manufacturing, 25(2), 272-283.【SCI, EI】
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Wu, Chien-Wei. (2012). A Bayesian approach for measuring process performance with asymmetric tolerances. European Journal of Industrial Engineering, 6(3), 347-368.【SCI, EI】
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Wu, Chien-Wei, Aslam, M. and Jun, C. H. (2012). Variables sampling inspection scheme for resubmitted lots based on the process capability index Cpk. European Journal of Operational Research, 217(3), 560-566.【SCI, EI】
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Wu, Chien-Wei, Liao, M. Y. and Chen, J. C. (2012). An improved approach for constructing lower confidence bound on process yield. European Journal of Industrial Engineering, 6(3), 369-390.【SCI, EI】
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Lin, T. Y., Wu, Chien-Wei, Chen, J. C. and Chiou, Y. H. (2011). Applying Bayesian approach to assess process capability for asymmetric tolerances based on Cpmk" index. Applied Mathematical Modelling, 35(9), 4473-4489.【SCI, EI】
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Wu, Chien-Wei and. Kuo, N. C. (2011). A fuzzy approach to evaluate process performance based on imprecise data. Journal of Quality, 18(6), 475-487.【EI】(Invited paper)
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Pearn, W. L., Liao, M. Y., Wu, Chien-Wei, and Chu, Y. T. (2011). Two tests for supplier selection based on process yield. Journal of Testing and Evaluation, 39(2), 126-133.【SCI, EI】
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Wu, Chien-Wei. (2011). Using a novel approach to assess process performance in the presence of measurement errors. Journal of Statistical Computation and Simulation, 81(3), 301-314.【SCI, EI】
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Liao, M. Y. and Wu, Chien-Wei. (2010). Evaluating process performance based on the incapability index for measurements with uncertainty. Expert Systems with Applications, 37(8), 5999-6006.【SCI, EI】
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Wu, Chien-Wei and Huang, P. H. (2010). Generalized confidence intervals for comparing the capability of two processes. Communications in Statistics: Theory and Methods, 39(13), 2351-2364.【SCI, EI】
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Wu, Chien-Wei, Liao, M. Y. and Shu, M. H. (2010). Process performance evaluation with imprecise information. Journal of Testing and Evaluation, 38(2), 137-142. 【SCI, EI】
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Wu, Chien-Wei, Shu, M. H., Pearn, W. L. and Tai, Y. C. (2010). Estimating and testing process accuracy with extension to asymmetric tolerances. Quality & Quantity, 44(5), 985-995.【SSCI, SCI】
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Liao, M. Y. and Wu, Chien-Wei (2010). An alternative approach to controlling tool wear problem with an application to grinding wheels management in manufacturing silicon wafers. Journal of Information and Optimization Sciences, 31(1), 231-244.【EI】
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Wu, Chien-Wei. (2010). Implementation and power analysis of a supplier selection method for unilateral processes. International Journal of Reliability and Quality Performance, 2(1), 43-52. (Invited paper)
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Liao, M. Y., Kang, H. Y., Lee, A. H. I. and Wu, Chien-Wei (2010). Capability testing based on subsamples: a case on photolithography process control in wafer fabrication. Journal of Testing and Evaluation, 38(2), 222-231.【SCI, EI】
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Wu, Chien-Wei and Lin, T. Y. (2009). A Bayesian procedure for assessing process performance based on the third generation capability index. Journal of Applied Statistics. 36(11), 1205-1223.【SCI】
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Wu, Chien-Wei, Shu, M. H. and Cheng, F. T. (2009). Generalized confidence intervals for assessing process capability of multiple production lines. Quality and Reliability Engineering International, 25(6), 701-716.【SCI, EI】
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Wu, Chien-Wei and Liao, M. Y. (2009). Estimating and testing process yield with imprecise data. Expert Systems with Applications, 36(8), 11006-11012.【SCI, EI】
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Wu, Chien-Wei, Shu, M. H. Pearn, W. L. and Cheng, F. T. (2009). A comparison of methods for estimating loss-based capability index. Journal of Statistical Computation and Simulation, 79(9), 1129-1141.【SCI, EI】
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Wu, Chien-Wei, Pearn, W. L. and Kotz, S. (2009). An overview of theory and practice on process capability indices for quality assurance. International Journal of Production Economics, 117(2), 338-359.【SCI, EI】
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Wu, Chien-Wei (2009). Decision-making in testing process performance with fuzzy data. European Journal of Operational Research, 193(2), 499-509.【SCI, EI】
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Chang, Y. C. and Wu, Chien-Wei. (2008). Assessing process capability based on the lower confidence bound of Cpk for asymmetric tolerances. European Journal of Operational Research, 190(1), 205-227.【SCI, EI】
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Wu, Chien-Wei (2008). Assessing process capability based on Bayesian approach with subsamples. European Journal of Operational Research, 184(1), 207-228.【SCI, EI】
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Wu, Chien-Wei and Pearn, W. L. (2008). A variables sampling plan based on Cpmk for product acceptance determination. European Journal of Operational Research, 184(2), 549-560.【SCI, EI】
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Wu, Chien-Wei and Chang, Y. C. (2008). A hypothesis testing procedure on assessing process performance for asymmetric tolerances. Communications in Statistics: Theory and Methods, 37(12), 1959-1976.【SCI, EI】
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Hsu, B. M., Wu, Chien-Wei and Shu, M. H. (2008). Generalized confidence intervals for the process capability index Cpm. Metrika - International Journal for Theoretical and Applied Statistics, 68(1), 65-82.【SCI】
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Wu, Chien-Wei, Shu, M. H., Pearn, W. L. and Liu, K. H. (2008). Bootstrap approach for supplier selection based on production yield. International Journal of Production Research, 46(18), 5211-5230.【SCI, EI】
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Chang, Y. C., Pearn, W. L. and Wu, Chien-Wei (2007). On the sampling distributions of the estimated process loss indices with asymmetric tolerances. Communications in Statistics: Simulation and Computation, 36(6), 1153-1170.【SCI, EI】
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Wu, Chien-Wei (2007). An alternative approach to test process capability for unilateral specification with subsamples. International Journal of Production Research, 45(22), 5397-5415.【SCI, EI】
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Huwang, L., Yeh, A. B. and Wu, Chien-Wei (2007). Monitoring multivariate process variability for individual observations. Journal of Quality Technology, 39(3), 258-278.【SCI, EI】
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Wu, Chien-Wei and Shu, M. H. (2007). A Bayesian procedure for assessing process performance based on expected relative loss with asymmetric tolerances. Journal of Applied Statistics, 34(9), 1109-1123.【SCI】
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Wu, Chien-Wei, Pearn, W. L., Chang, C. S. and Chen, H. C. (2007). Accuracy analysis of the percentile method for estimating non-normal manufacturing quality. Communications in Statistics: Simulation and Computation, 36(3), 657-697.【SCI, EI】
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Pearn, W. L. and Wu, Chien-Wei (2007). An effective decision making method for product acceptance. Omega - International Journal of Management Science, 35(1), 12-21.【SSCI, SCI】
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Pearn, W. L., Chang, Y. C. and Wu, Chien-Wei (2006). Measuring process performance based on expected loss for asymmetric tolerances. Journal of Applied Statistics, 33(10), 1105-1120.【SCI】
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Wu, Chien-Wei and Pearn, W. L. (2006). Bayesian approach for measuring EEPROM process capability based on the one-sided indices CPU and CPL. International Journal of Advanced Manufacturing Technology, 31(1-2), 135-144.【SCI, EI】
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Pearn, W. L., Chang, Y. C. and Wu, Chien-Wei (2006). Multiprocess performance analysis chart based on process loss indices. International Journal of System Science, 37(7), 429-435.【SCI, EI】
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Pearn, W. L., Hsu, Y. C. and Wu, Chien-Wei (2006). Tool replacement for production with a low fraction of defectives. International Journal of Production Research, 44(12), 2313-2326.【SCI, EI】
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Pearn, W. L., Lin, P. C., Chang, Y. C. and Wu, Chien-Wei (2006). Quality yield measure for processes with asymmetric tolerances. IIE Transactions in Quality and Reliability Engineering, 38(8), 619-633.【SCI, EI】
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Pearn, W. L. and Wu, Chien-Wei (2006). Production quality and yield assurance for processes with multiple independent characteristics. European Journal of Operational Research, 173(2), 637-647. 【SCI, EI】
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Pearn, W. L. and Wu, Chien-Wei (2006). Variables sampling plans with PPM fraction of defectives and process loss consideration. Journal of the Operational Research Society, 57(4), 450-459. 【SSCI, SCI】
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Pearn, W. L. and Wu, Chien-Wei (2006). Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives. Omega - International Journal of Management Science, 34(1), 90-101.【SSCI, SCI】
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Yeh, A. B., Huwang, L. and Wu, Chien-Wei (2005). A multivariate EWMA control chart for monitoring process variability with individual observations. IIE Transactions in Quality and Reliability Engineering, 37(11), 1023-1035.【SCI, EI】
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Pearn, W. L. and Wu, Chien-Wei (2005). An effective modern approach for measuring high-tech product manufacturing process quality. Journal of the Chinese Institute of Industrial Engineers, 22(2), 119-133.【EI】(Invited paper)
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Pearn, W. L., Chang, Y. C. and Wu, Chien-Wei (2005). Bootstrap approach for estimating process quality yield with application to light emitting diodes. International Journal of Advanced Manufacturing Technology, 25(5-6), 560-570.【SCI, EI】
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Pearn, W. L., Wu, Chien-Wei and Chuang, H. C. (2005). Procedures for testing manufacturing precision Cp based on (Xbar, R) or (Xbar, S) control chart samples. International Journal of Advanced Manufacturing Technology, 25(5-6), 598-607.【SCI, EI】
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Pearn, W. L. and Wu, Chien-Wei (2005). Process capability assessment for index Cpk based on Bayesian approach. Metrika - International Journal for Theoretical and Applied Statistics, 61(2), 221-234.【SCI】
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Pearn, W. L., Wu, Chien-Wei and Wang, K. H. (2005). Capability measure for asymmetric tolerances non-normal processes applied to speaker driver manufacturing. International Journal of Advanced Manufacturing Technology, 25(5-6), 506-515.【SCI, EI】
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Wu, Chien-Wei and Pearn, W. L. (2005). Measuring manufacturing capability for couplers and wavelength division multiplexers. International Journal of Advanced Manufacturing Technology, 25(5-6), 533-541.【SCI, EI】
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Pearn, W. L. and Wu, Chien-Wei (2005). A Bayesian approach for assessing process precision based on multiple samples. European Journal of Operational Research, 165(3), 685-695.【SCI, EI】
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Wu, Chien-Wei and Pearn, W. L. (2005). Capability testing based on Cpm with multiple samples. Quality and Reliability Engineering International, 21(1), 29-42.【SCI, EI】
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Pearn, W. L., Chang, Y. C. and Wu, Chien-Wei (2004). Quality-yield measure for production with very low fraction defective. International Journal of Production Research, 42(23), 4909-4925. 【SCI, EI】
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Pearn, W. L., Chang, Y. C. and Wu, Chien-Wei (2004). Distributional and inferential properties of the process loss indices. Journal of Applied Statistics, 31(9), 1115-1135.【SCI】
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Pearn, W. L., Wu, Chien-Wei and Lin, H. C. (2004). Procedure for supplier selection based on Cpm applied to super twisted nematic liquid crystal display processes. International Journal of Production Research, 42(13), 2719-2734.【SCI, EI】